Non-destructive nanoscale material characterisation via terahertz and midinfrared scattering-type near field optical microscopy (THz s-SNOM).

Boland, J. (Invited speaker)

EEE - Academic & Research

Activity: Talk or presentation › Invited talk › Research

Period	4 Jul 2022 → 6 Jul 2022
Event title	AFM & SPM Meeting 2022
Event type	Conference
Location	Online, United KingdomShow on map
Degree of Recognition	National

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