Hitachi S-3400 Scanning Electron Microscope

Facility/equipment: Equipment

    Details

    Description

    The Hitachi S-3400N SEM is a high performance, user-friendly scanning electron microscope with new improvements that allow the best results for a wide range of applications. Features include:
    Unique VP-mode that allows microscopy of wet, oily and non-conductive samples in their natural state without the need of conventional sample preparation.
    3.0nm resolution guaranteed in high vacuum mode or 4.0nm in VP-mode.
    Resolution:
    3.0nm High Vacuum Mode
    4.0nm Variable Pressure Mode

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