Hitachi S-3400 Scanning Electron Microscope

  • David Whitehead (Academic lead)

Facility/equipment: Equipment



    The Hitachi S-3400N SEM is a high performance, user-friendly scanning electron microscope with new improvements that allow the best results for a wide range of applications. Features include:
    Unique VP-mode that allows microscopy of wet, oily and non-conductive samples in their natural state without the need of conventional sample preparation.
    3.0nm resolution guaranteed in high vacuum mode or 4.0nm in VP-mode.
    3.0nm High Vacuum Mode
    4.0nm Variable Pressure Mode


    Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.