Details
Description
The Hitachi S-3400N SEM is a high performance, user-friendly scanning electron microscope with new improvements that allow the best results for a wide range of applications. Features include:
Unique VP-mode that allows microscopy of wet, oily and non-conductive samples in their natural state without the need of conventional sample preparation.
3.0nm resolution guaranteed in high vacuum mode or 4.0nm in VP-mode.
Resolution:
3.0nm High Vacuum Mode
4.0nm Variable Pressure Mode
Unique VP-mode that allows microscopy of wet, oily and non-conductive samples in their natural state without the need of conventional sample preparation.
3.0nm resolution guaranteed in high vacuum mode or 4.0nm in VP-mode.
Resolution:
3.0nm High Vacuum Mode
4.0nm Variable Pressure Mode
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