Polytec TopMap scanning interferometer

  • David Whitehead (Platform Lead) &
  • Daniel Wilson (Technical Specialist)

Facility/equipment: Equipment



    TopMap Micro.View® is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful profilometer. Its extended 100 mm vertical measurement range combined with the innovative CST Continuous Scanning Technology enables topography analysis at nm resolution with plenty of freedom for sample handling and positioning.This convenient table-top setup of an optical profiler features integrated electronics and a smart feature called Focus Finder for simplified, fast and efficient areal surface characterization for quality control.


    Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.