Proto iXRD Combo

  • Gary Harrison (Academic lead)

Facility/equipment: Equipment

    Equipments Details


    Along with conventional diffractometers the XRD unit also hosts two systems optimised for residual stress analysis. [Proto1] is used for the non-destructive measurement of surface residual (elastic) stresses in a range of crystalline materials. This instrument can complete a measurement in a matter of minutes thanks in part to PROTO XRD’s proprietary position sensitive scintillation detectors (PSSD). The fibre optics allows the detector electronics to be located remote from the sensing head making it suitable for measurements in harsh environments and small spaces. The use of multiple detectors enables two sections of the diffraction cone to be captured simultaneously and this greatly reduces the data collection time.

    This method uses the crystal lattice as an “atomic scale strain gauge”. Very small changes in the crystal lattice spacings (which are caused by the residual stresses in the sample) can be measured. The residual stress can then be calculated using the sin2ψ method and the appropriate elastic constants. Three X-ray tube anodes are available, Mn, Cr and Cu; these cover virtually all materials, most metals, for example aluminium, iron and nickel super alloys, as well as ceramics.

    This machine is open access to registered users via the sample submission queue or trained users via the XRD portal.

    This machine can operate using three x-ray tubes. The choice of tube being dependent upon the material under investigation.
    Copper Point Focus X-ray tube with Nickel kβ absorber (0.02 mm; Kβ = 1.392250 Å) producing Kα radiation (Kα1 = 1.540598 Å, Kα2 = 1.544426 Å, Kα ratio 0.5, Kαav = 1.541874 Å).

    Manganese Point Focus X-ray tube with Chromium kβ absorber (0.02 mm; Kβ = 2.08488 Å) producing Kα radiation (Kα1 = 2.105822 Å, Kα2 = 2.101854 Å, Kα ratio 0.5, Kαav = 1.541874 Å).

    Chromium Point Focus X-ray tube with Vanadium kβ absorber (0.01 mm; Kβ = 2.08487 Å) producing Kα radiation (Kα1 = 2.28970 Å, Kα2 = 2.29361 Å, Kα ratio 0.5, Kαav = 2.291 Å).
    Samples Size and Type

    Due to the motorised x,y-stage and the superb Proto XRD sample stage technology this machine can accommodate a range of sample shapes and sizes which will fit within the cabinet up to a maximum weight of 90 kg. For very large samples [Proto2] is available.

    AttachmentsXEC Determination via 4-point Bend Quarter radius arc: 130-170° 2θ
    Half radius arc arcs: 120-170° 2θ, 130-170° 2θ, 140-170° 2θ
    X-ray point apertures: 0.2, 0.5, 1.0, 2.0, 3.0, 4.0 mm diameter
    X-ray rectangular apertures: 0.5x3, 1x3, 0.5x5, 1x5, 2x5 mm
    High stress standards: Fe, 316, Ti & Al
    Zero stress powders: Fe, 316, Ti & Al

    Example - Setups
    Coming soon.


    NameProto iXRD - MG40P
    ManufacturersProto Manufacturing


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