Time-of-Flight Secondary Ion Mass Spectrometry

Ionoptika J105 SIMS at the University of Manchester is a Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) instrument that can be used to provide elemental and molecular chemical maps of surface and subsurface regions in all types of samples.
Typical application include imaging molecular surface contaminations or features over surface areas upto 1 cm2 and for smaller regions determine depth penetration and the chemistry of buried layers. The chemical specificity of mass spectrometry analysis is particularly powerful in life science applications and in complex hard or soft materials and devices.

Key Specifications
-Rapid high resolution 2D and 3D molecular imaging.
-Typical Spatial Resolution: 300 nm 40 keV C60; 70 keV Gas Cluster Ion Beam (Ar)_n and (H2O)_n: 1 µm.
-Glovebox and LN2: Cooled Cryo-stage for analysis for air sensitive or hydrated (biological) specimens.
-Sample: Must be compatible with High Vacuum and of dimensions of 20 × 20 × 5 mm.
-Parallel Detection of masses upto several kDa.
-Typical Mass Resolution ((M/ΔM) up to 15,000.