Personal profile

Research interests

Electron microscopy, Focused Ion Beam (FIB), Electron Backscatter Diffraction (EBSD) and 3D EBSD.

Overview

Dr. Ali Gholinia is a Research Fellow working in the Department of Materials at the  University of Manchester. He obtained his PhD from Materials Science Centre at the University of Manchester. After post-doctoral positions at the University of Manchester in UK and TU-Delft in the Netherlands, he worked at HKL and Oxford Instruments in Denmark on development of electron backscatter diffraction (EBSD) technique and its applications, before taking up his current position in Manchester.
His expertise include materials characterisation and processing.  He has been working with in the field of electron microscopy for over 20 years.  His materials characterisation expertise include microstructure and phase analysis using scanning electron microscopy (SEM), focused ion beam (FIB) and electron backscatter diffraction (EBSD).  His research focus is on 3D correlative and multi-modal microstructure characterisation of materials between X-ray computed tomography and serial sectioning techniques in SEM.  Furthermore, he is interested in linking materials microstructure and mechanical properties using in-situ tensile deformation in SEM.  

Expertise related to UN Sustainable Development Goals

In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):

  • SDG 7 - Affordable and Clean Energy

Education/Academic qualification

Doctor of Philosophy, The University of Manchester

1 Oct 19921 Oct 1994

Award Date: 1 Oct 1994

Master of Science, The University of Manchester

1 Oct 19901 Oct 1992

Award Date: 1 Oct 1992

Bachelor of Science, Middle East Technical University

1 Oct 19841 Oct 1988

Award Date: 1 Oct 1988

External positions

Applications group manager, Oxford Instruments NanoAnalysis

1 Jan 20021 Nov 2008

Research Scientist, Technische Universiteit Delft

1 Jan 20011 Jan 2002

Research Associate, University of Manchester (UOM)

1 Oct 19941 Jan 2001

Areas of expertise

  • Q Science (General)
  • Materials Science
  • Microscopy
  • Materials Characterisation
  • Imaging

Research Beacons, Institutes and Platforms

  • Energy
  • Advanced materials

Keywords

  • Electron Back Scatter Diffraction (EBSD)
  • Deformation and Recrystallisation
  • Three Dimensional Tomography
  • Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Materials Characterisation, FIB/SEM technical development
  • Energy Dispersive Spectroscopy (EDS)
  • in-situ tensile deformation
  • Electron Channelling Contrast Imaging (ECCI)
  • Serial Sectioning Technique (SST)

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