Schießl, I., Stetter, M., Mayhew, J. E. W., McLoughlin, N., Lund, J. S. & Obermayer, K., 2000, Mustererkennung 2000 22. DAGM-Symposium. Kiel, 13.–15. September 2000., G. S., , N. K. & , C. P. (eds.). 8 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review