Karen Kirkby

Search results

• 2008

  A Comparative Study of Interaction of End of Range (EOR) Defect Band with Upper Buried Oxide (BOX) Interface for B and BF(2) Implants in SOI and Bulk Silicon with Pre-Amorphizing Implant

  Kah, M., Smith, A. J., Hamilton, J. J., Yeong, S. H., Columbeau, B., Gwilliam, R., Webb, R. P. & Kirkby, K. J., 2008, Ion Implantation Technology 2008.

  Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review
• 1996

  Structural and compositional properties of ternary iron-cobalt silicides fabricated by ion beam synthesis

  Harry, M. A., Finney, M. S., Curello, G., Reeson, K. J., Yang, Z., Gwilliam, R. M. & Sealy, B. J., 1996, Ion Beam Modification of Materials. Williams, J. S., Elliman, R. G. & Ridgway, M. C. (eds.). Elsevier BV, p. 937-942 6 p.

  Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review