Stankowiak, G., Piat, M., Battistelli, E. S., D'Alessandro, G., De Bernardis, P., Petris, M. D., Gonzalez, M., Grandsire, L., Hamilton, J. C., Hoang, T. D., Masi, S., Marnieros, S., Mennella, A., Mousset, L., O'Sullivan, C., Prele, D., Tartari, A., Thermeau, J. P., Torchinsky, S. A. & Voisin, F.
& 30 others,
Zannoni, M., Ade, P., Alberro, J. G., Almela, A., Amico, G., Arnaldi, L. H., Auguste, D., Aumont, J., Azzoni, S., Banff, S., Belier, B., Baffu, A., Bennett, D., Berge, L., Bernard, J. P., Bersanelli, M., Bigot-Sazy, M. A., Burke, D., Garcia, B., Gilles, V., Maffei, B., May, A., McCulloch, M., Murphy, J. A., Murphy, J. D., Piccirillo, L., Pisano, G., Tucker, G., Tucker, C. & Wright, M.,
12 Dec 2020,
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X. Zmuidzinas, J. & Gao, J.-R. (eds.).
SPIE,
p. 155 1145328. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 11453).
Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review