WheatScan: Tractor-Mount Sensing for Precision Application of Nitrogen and Control of Milling Wheat Protein Content.

Grieve, Bruce (PI)

Department of Electrical & Electronic Engineering

5 Article
1 Conference contribution

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2015
Localized Multispectral Crop Imaging Sensors Engineering & Validation of a Cost Effective Plant Stress and Disease Sensor
Grieve, B., Gurkan, D. (Editor) & Baglio, S. (Editor), 11 Apr 2015, IEEE 2015 Sensors Applications Symposium. Gurkan, D. & Baglio, S. (eds.). Piscataway, New Jersey, USA: IEEE
Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

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