3D elemental mapping of materials and structures by laboratory scale spectroscopic X-ray tomography

C. K. Egan; S. D.M. Jacques; M. D. Wilson; M. C. Veale; P. Seller; R. A.D. Pattrick; P. J. Withers; R. J. Cernik

doi:10.1088/1742-6596/849/1/012013

3D elemental mapping of materials and structures by laboratory scale spectroscopic X-ray tomography

C. K. Egan^*, S. D.M. Jacques, M. D. Wilson, M. C. Veale, P. Seller, R. A.D. Pattrick, P. J. Withers, R. J. Cernik

^*Corresponding author for this work

Rutherford Appleton Laboratory

Research output: Contribution to journal › Conference article › peer-review

Abstract

Using a microfocus X-ray tube and pixelated energy-resolving detector it is possible to measure the X-ray absorption spectrum of a material with high spatial resolution. Given sufficient energy resolution in the detector it is possible to detect and identify absorption edges which are characteristic to individual chemical elements. Using computed tomography the three dimensional (3D) internal elemental chemistry of an object can be reconstructed. The application of spectroscopic X-ray tomography is demonstrated by mapping distribution of heavy elements inside a mineralised ore sample. We correlate and validate this data with high resolution X-ray tomography and energy-dispersive X-ray spectroscopy data.

Original language	English
Article number	012013
Number of pages	4
Journal	Journal of Physics: Conference Series
Volume	849
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/849/1/012013 https://doi.org/{10.1088/1742-6596/849/1/012013}
Publication status	Published - 14 Jun 2017
Event	13th International X-ray Microscopy Conference, XRM 2016 - Oxford, United Kingdom Duration: 15 Aug 2016 → 19 Aug 2016

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Dalton Nuclear Institute

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Egan, C. K., Jacques, S. D. M., Wilson, M. D., Veale, M. C., Seller, P., Pattrick, R. A. D., Withers, P. J., & Cernik, R. J. (2017). 3D elemental mapping of materials and structures by laboratory scale spectroscopic X-ray tomography. Journal of Physics: Conference Series, 849(1), Article 012013. https://doi.org/10.1088/1742-6596/849/1/012013, https://doi.org/{10.1088/1742-6596/849/1/012013}

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abstract = "Using a microfocus X-ray tube and pixelated energy-resolving detector it is possible to measure the X-ray absorption spectrum of a material with high spatial resolution. Given sufficient energy resolution in the detector it is possible to detect and identify absorption edges which are characteristic to individual chemical elements. Using computed tomography the three dimensional (3D) internal elemental chemistry of an object can be reconstructed. The application of spectroscopic X-ray tomography is demonstrated by mapping distribution of heavy elements inside a mineralised ore sample. We correlate and validate this data with high resolution X-ray tomography and energy-dispersive X-ray spectroscopy data.",

author = "Egan, {C. K.} and Jacques, {S. D.M.} and Wilson, {M. D.} and Veale, {M. C.} and P. Seller and Pattrick, {R. A.D.} and Withers, {P. J.} and Cernik, {R. J.}",

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AU - Egan, C. K.

AU - Jacques, S. D.M.

AU - Wilson, M. D.

AU - Veale, M. C.

AU - Seller, P.

AU - Pattrick, R. A.D.

AU - Withers, P. J.

AU - Cernik, R. J.

PY - 2017/6/14

Y1 - 2017/6/14

N2 - Using a microfocus X-ray tube and pixelated energy-resolving detector it is possible to measure the X-ray absorption spectrum of a material with high spatial resolution. Given sufficient energy resolution in the detector it is possible to detect and identify absorption edges which are characteristic to individual chemical elements. Using computed tomography the three dimensional (3D) internal elemental chemistry of an object can be reconstructed. The application of spectroscopic X-ray tomography is demonstrated by mapping distribution of heavy elements inside a mineralised ore sample. We correlate and validate this data with high resolution X-ray tomography and energy-dispersive X-ray spectroscopy data.

AB - Using a microfocus X-ray tube and pixelated energy-resolving detector it is possible to measure the X-ray absorption spectrum of a material with high spatial resolution. Given sufficient energy resolution in the detector it is possible to detect and identify absorption edges which are characteristic to individual chemical elements. Using computed tomography the three dimensional (3D) internal elemental chemistry of an object can be reconstructed. The application of spectroscopic X-ray tomography is demonstrated by mapping distribution of heavy elements inside a mineralised ore sample. We correlate and validate this data with high resolution X-ray tomography and energy-dispersive X-ray spectroscopy data.

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SN - 1742-6588

VL - 849

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

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T2 - 13th International X-ray Microscopy Conference, XRM 2016

Y2 - 15 August 2016 through 19 August 2016

ER -

3D elemental mapping of materials and structures by laboratory scale spectroscopic X-ray tomography

Abstract

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