3D inspection of fabrication and degradation processes from X-ray (micro) tomography images using a hole closing algorithm

L. Babout, M. Janaszewski, D. Bakavos, S.A. McDonald, P.B. Prangnell, T.J. Marrow, P.J. Withers

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Original language	Undefined
Title of host publication	2010 IEEE International Conference on Imaging Systems and Techniques, IST 2010 - Proceedings
DOIs	https://doi.org/10.1109/IST.2010.5548537
Publication status	Published - 2010

Access to Document

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title = "3D inspection of fabrication and degradation processes from X-ray (micro) tomography images using a hole closing algorithm",

author = "L. Babout and M. Janaszewski and D. Bakavos and S.A. McDonald and P.B. Prangnell and T.J. Marrow and P.J. Withers",

year = "2010",

doi = "10.1109/IST.2010.5548537",

language = "Undefined",

booktitle = "2010 IEEE International Conference on Imaging Systems and Techniques, IST 2010 - Proceedings",

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3D inspection of fabrication and degradation processes from X-ray (micro) tomography images using a hole closing algorithm. / Babout, L.; Janaszewski, M.; Bakavos, D. et al.
2010 IEEE International Conference on Imaging Systems and Techniques, IST 2010 - Proceedings. 2010.

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - 3D inspection of fabrication and degradation processes from X-ray (micro) tomography images using a hole closing algorithm

AU - Babout, L.

AU - Janaszewski, M.

AU - Bakavos, D.

AU - McDonald, S.A.

AU - Prangnell, P.B.

AU - Marrow, T.J.

AU - Withers, P.J.

PY - 2010

Y1 - 2010

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77957855110&partnerID=MN8TOARS

U2 - 10.1109/IST.2010.5548537

DO - 10.1109/IST.2010.5548537

M3 - Conference contribution

BT - 2010 IEEE International Conference on Imaging Systems and Techniques, IST 2010 - Proceedings

ER -