Abstract
The deep-level thermal activation energy spectrum of N-doped liquid-phase-epitaxial (LPE) and liquid-encapsulated-Czochralski (LEC) -grown GaP has been investigated using Schottky barrier thermally stimulated-current (TSC) measurements. We detect a center at Ec-Et=0.42 eV whose presence in the lattice depends on the deliberate addition of N to the material. The concentration of this center varies approximately as (N d-Na)2 in n-type material, and the value of electron capture cross section for the center (St≈7×10 -15 cm2) indicates that it could be a strong recombination center in N-doped p-type GaP. Separate experiments suggest that this center is strongly localized, and that it is not a simple complex involving shallow donors and native defects.
Original language | English |
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Pages (from-to) | 122-124 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 26 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1 Dec 1975 |