A deep center associated with the presence of nitrogen in GaP

B. L. Smith*, T. J. Hayes, A. R. Peaker, D. R. Wight

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The deep-level thermal activation energy spectrum of N-doped liquid-phase-epitaxial (LPE) and liquid-encapsulated-Czochralski (LEC) -grown GaP has been investigated using Schottky barrier thermally stimulated-current (TSC) measurements. We detect a center at Ec-Et=0.42 eV whose presence in the lattice depends on the deliberate addition of N to the material. The concentration of this center varies approximately as (N d-Na)2 in n-type material, and the value of electron capture cross section for the center (St≈7×10 -15 cm2) indicates that it could be a strong recombination center in N-doped p-type GaP. Separate experiments suggest that this center is strongly localized, and that it is not a simple complex involving shallow donors and native defects.

Original languageEnglish
Pages (from-to)122-124
Number of pages3
JournalApplied Physics Letters
Volume26
Issue number3
DOIs
Publication statusPublished - 1 Dec 1975

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