A far-infrared RAIRS investigation of SnCl4 and water on thin-film carbon and silica surfaces

M. J. Pilling; P. Gardner; R. Kausar; M. E. Pemble; M. Surman

A far-infrared RAIRS investigation of SnCl4 and water on thin-film carbon and silica surfaces

M. J. Pilling, P. Gardner, R. Kausar, M. E. Pemble, M. Surman

Research output: Contribution to journal › Article › peer-review

Abstract

Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl4 and water on thin-film silica and carbon surfaces. This has been made possible by growing the thin films on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. In addition to the observation of a strongly chemisorbed species on the silica surface the spectra from both surfaces indicate the presence of a more weakly bound complex containing both water and SnCl4. © 1999 Elsevier Science B.V. All rights reserved.

Original language	English
Pages (from-to)	22-26
Number of pages	4
Journal	Surface Science
Volume	433-435
Publication status	Published - 2 Aug 1999

Keywords

Carbon
Chemisorption
Glass surfaces
Reflection spectroscopy
Silicon oxide
SnCl4
Water

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title = "A far-infrared RAIRS investigation of SnCl4 and water on thin-film carbon and silica surfaces",

abstract = "Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl4 and water on thin-film silica and carbon surfaces. This has been made possible by growing the thin films on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. In addition to the observation of a strongly chemisorbed species on the silica surface the spectra from both surfaces indicate the presence of a more weakly bound complex containing both water and SnCl4. {\textcopyright} 1999 Elsevier Science B.V. All rights reserved.",

keywords = "Carbon, Chemisorption, Glass surfaces, Reflection spectroscopy, Silicon oxide, SnCl4, Water",

author = "Pilling, {M. J.} and P. Gardner and R. Kausar and Pemble, {M. E.} and M. Surman",

note = "14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis AUG 31-SEP 04, 1998 BIRMINGHAM, ENGLAND",

year = "1999",

month = aug,

day = "2",

language = "English",

volume = "433-435",

pages = "22--26",

journal = "Surface Science",

issn = "0039-6028",

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TY - JOUR

T1 - A far-infrared RAIRS investigation of SnCl4 and water on thin-film carbon and silica surfaces

AU - Pilling, M. J.

AU - Gardner, P.

AU - Kausar, R.

AU - Pemble, M. E.

AU - Surman, M.

N1 - 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis AUG 31-SEP 04, 1998 BIRMINGHAM, ENGLAND

PY - 1999/8/2

Y1 - 1999/8/2

N2 - Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl4 and water on thin-film silica and carbon surfaces. This has been made possible by growing the thin films on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. In addition to the observation of a strongly chemisorbed species on the silica surface the spectra from both surfaces indicate the presence of a more weakly bound complex containing both water and SnCl4. © 1999 Elsevier Science B.V. All rights reserved.

AB - Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl4 and water on thin-film silica and carbon surfaces. This has been made possible by growing the thin films on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. In addition to the observation of a strongly chemisorbed species on the silica surface the spectra from both surfaces indicate the presence of a more weakly bound complex containing both water and SnCl4. © 1999 Elsevier Science B.V. All rights reserved.

KW - Carbon

KW - Chemisorption

KW - Glass surfaces

KW - Reflection spectroscopy

KW - Silicon oxide

KW - SnCl4

KW - Water

M3 - Article

SN - 0039-6028

VL - 433-435

SP - 22

EP - 26

JO - Surface Science

JF - Surface Science

ER -

A far-infrared RAIRS investigation of SnCl4 and water on thin-film carbon and silica surfaces

Abstract

Keywords

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