A framework linking nowledge of insulation aging to asset management

Sanjay Bahadoorsingh, Simon Rowland

    Research output: Contribution to journalArticlepeer-review

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    Abstract

    The multifactor framework developed here provides a template for asset managers, plant managers, and those involved in the area of network performance and material reliability to assess the available knowledge of the condition of any insulation system. In order to realize maximum potential of this framework, mathematical modeling must be integrated using all existing models, tools, and techniques for assessing insulation systems at the level of aging processes. This is no simple task as the scope is extremely wide and deep, spanning all insulation systems and all modes of failure under a myriad of environmental operating conditions. A key use of the framework is to openly identify what is not known, and so identify uncertainties for further evaluation. The framework allows for stochastic modeling of the working environment, including stress factors such as electrical, thermal, mechanical, environmental, chemical, and thermal. More importantly, the framework establishes links between the physics and chemistry of insulation degradation and asset management. Such a tool can complement and improve asset management strategies and provide a platform for future dielectric research. One key issue is the need to identify "end-points", or critical limits of material conditions after which aging leads to rapid failure. It is considered that understanding and identifying changes to dominant aging processes during equipment's life are critical to improved asset management. © 2008 IEEE.
    Original languageEnglish
    Pages (from-to)38-46
    Number of pages8
    JournalIEEE Electrical Insulation Magazine
    Volume24
    Issue number3
    DOIs
    Publication statusPublished - 2008

    Keywords

    • Aging
    • Asset management
    • Condition monitoring
    • Dielectric
    • Framework
    • Insulation
    • Plant
    • Power quality
    • Reliability

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