A Full-Oxide CMOS Operational Amplifier Based on n-Type IGZO and p-Type SnO Thin-Film Transistors

Mingyu Zhuang, Mingyang Wang, Zhiyuan Wang, Jiawei Zhang, Qian Xin, Aimin Song

Research output: Contribution to journalArticlepeer-review

Abstract

Oxide semiconductors have a promising potential in future wearable, transparent, and flexible electronics, but the research to date is mostly limited to n-type thin-film transistors (TFTs) and circuits. Here, an entirely oxide-semiconductor-based complementary operational amplifier (op-amp) is developed, comprising n-type indium-gallium-zinc-oxide (IGZO) and p-type tin monoxide (SnO). The IGZO TFTs show a mobility of 21.5 cm 2/Vs , a threshold voltage of 4.8 V, and a subthreshold swing of 0.2 V/decade. The SnO TFTs exhibit a mobility of 1.19 cm 2/Vs and a threshold voltage of -3.5 V. The op-amp takes an area of 500× 250,μ m. Operating under a ±12-V supply, the op-amp achieves a negative-feedback gain of 54 dB, the highest among the reported op-amps based on oxide semiconductor TFTs. The power consumption of the op-amp is 0.2 mW. The op-amp also exhibits a unit-gain frequency of 300 kHz, a bandwidth of 9 kHz, and a gain-bandwidth product (GBWP) of 4.5 MHz.

Original languageEnglish
Pages (from-to)3691-3696
Number of pages6
JournalIEEE Transactions on Electron Devices
Volume71
Issue number6
Early online date26 Apr 2024
DOIs
Publication statusPublished - 23 May 2024

Keywords

  • CMOS
  • indium-gallium-zinc-oxide (IGZO)
  • operational amplifier (op-amp)
  • oxide semiconductor
  • thin-film transistor (TFT)
  • tin monoxide (SnO)

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