A High-Resolution Study of Chemical Aging Prior to Electrical Tree Growth

H. McDonald, S. M. Rowland, Suzanne Morsch

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A study of chemical aging prior to electrical tree initiation has been undertaken using a high-resolution chemical analysis technique, AFM-IR (atomic force microscopy-infrared spectroscopy). This technique has provided chemical characterisation with a spatial resolution of around 50 nm. It is seen that the use of tests on this scale provide information and insight which was not previously observable using lower resolution techniques. Previously unobserved degradation products are observed in epoxy resin prior to tree initiation with ethers (C-O) and methyl groups (CH3) appearing to form alongside carbonyls (C=O), each occurring in different locations around the needle tip. Such spatial resolution of aging chemistry will allow improved models of tree initiation and growth to be developed.

Original languageEnglish
Title of host publicationProceedings of the 2020 IEEE 3rd International Conference on Dielectrics, ICD 2020
PublisherIEEE
Pages17-20
Number of pages4
ISBN (Electronic)9781728189833
DOIs
Publication statusPublished - 5 Jul 2020
Event3rd IEEE International Conference on Dielectrics, ICD 2020 - Virtual, Valencia, Spain
Duration: 5 Jul 20209 Jul 2020

Publication series

NameProceedings of the 2020 IEEE 3rd International Conference on Dielectrics, ICD 2020

Conference

Conference3rd IEEE International Conference on Dielectrics, ICD 2020
Country/TerritorySpain
CityVirtual, Valencia
Period5/07/209/07/20

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