TY - GEN
T1 - A High-Resolution Study of Chemical Aging Prior to Electrical Tree Growth
AU - McDonald, H.
AU - Rowland, S. M.
AU - Morsch, Suzanne
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/7/5
Y1 - 2020/7/5
N2 - A study of chemical aging prior to electrical tree initiation has been undertaken using a high-resolution chemical analysis technique, AFM-IR (atomic force microscopy-infrared spectroscopy). This technique has provided chemical characterisation with a spatial resolution of around 50 nm. It is seen that the use of tests on this scale provide information and insight which was not previously observable using lower resolution techniques. Previously unobserved degradation products are observed in epoxy resin prior to tree initiation with ethers (C-O) and methyl groups (CH3) appearing to form alongside carbonyls (C=O), each occurring in different locations around the needle tip. Such spatial resolution of aging chemistry will allow improved models of tree initiation and growth to be developed.
AB - A study of chemical aging prior to electrical tree initiation has been undertaken using a high-resolution chemical analysis technique, AFM-IR (atomic force microscopy-infrared spectroscopy). This technique has provided chemical characterisation with a spatial resolution of around 50 nm. It is seen that the use of tests on this scale provide information and insight which was not previously observable using lower resolution techniques. Previously unobserved degradation products are observed in epoxy resin prior to tree initiation with ethers (C-O) and methyl groups (CH3) appearing to form alongside carbonyls (C=O), each occurring in different locations around the needle tip. Such spatial resolution of aging chemistry will allow improved models of tree initiation and growth to be developed.
UR - http://www.scopus.com/inward/record.url?scp=85101282287&partnerID=8YFLogxK
U2 - 10.1109/ICD46958.2020.9341906
DO - 10.1109/ICD46958.2020.9341906
M3 - Conference contribution
AN - SCOPUS:85101282287
T3 - Proceedings of the 2020 IEEE 3rd International Conference on Dielectrics, ICD 2020
SP - 17
EP - 20
BT - Proceedings of the 2020 IEEE 3rd International Conference on Dielectrics, ICD 2020
PB - IEEE
T2 - 3rd IEEE International Conference on Dielectrics, ICD 2020
Y2 - 5 July 2020 through 9 July 2020
ER -