A Mobius transformation-based liftoff effect reduction method for crack classification and prediction in eddy current testing

Yu Li, Zihan Xia, Saibo She, Yuchun Shao, Yinchao Yang, Wuliang Yin

Research output: Contribution to journalArticlepeer-review

Abstract

In eddy current (EC) defect evaluation, accurate determination of the crack depth is crucial. The lift-off signal on the complex impedance plane is not necessarily horizontal and mostly arc-shaped, which makes it difficult to separate from crack signals, which can have various orientations depending on probe characteristics and frequencies. Phase rotation is normally used to align the lift-off signal to the real axis and defect signal is read from the imaginary axis. However, this approach proves challenging to separate lift-off and defect signals within the complex plane in many cases.
To address this issue, this study proposes and implements a Mobius transformation that linearizes the arc-shaped lift-off signals on the complex plane, enabling more accurate extraction of crack signals unaffected by lift-off signal height. Furthermore, it is demonstrated through k-nearest neighbors (kNN) that the transformed crack signals can still be effectively quantified.
Original languageEnglish
Article number103261
JournalNDT & E International
Volume149
Early online date23 Oct 2024
DOIs
Publication statusPublished - 1 Jan 2025

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