A near-ambient-temperature-control cell for use with synchrotron x-ray powder diffraction

R J Cernik, S R Craig, K J Roberts, J N Sherwood

    Research output: Contribution to journalArticlepeer-review

    Abstract

    A low-cost cell was designed and built for synchrotron x-ray powder diffraction studies of materials with low m.ps. The cell was operated between 253 and 323 K with a temp. stability of better than 0.1 K. The construction of the cell allows free rotation of the sample during a scan to maximize the no. of powder grains in the reflecting position. The cell was used to study a transition from an ordered to a rotator phase in hexadecane occurring at 278 K and the results from that study are reported. [on SciFinder(R)]
    Original languageEnglish
    JournalJ. Appl. Crystallogr.
    Volume28
    Issue number5
    DOIs
    Publication statusPublished - 1995

    Keywords

    • Synchrotron radiation (x-ray diffractometer with near-ambient-temp.-control cell for use with)
    • Diffractometers (x-ray, with near-ambient-temp.-control cell for use with synchrotron radiation)
    • synchrotron powder diffractometer ambient temp control

    Fingerprint

    Dive into the research topics of 'A near-ambient-temperature-control cell for use with synchrotron x-ray powder diffraction'. Together they form a unique fingerprint.

    Cite this