A new device for the study of electron-ion interactions

FJ Currell, J Aiken, KF Dunn, X Lu, RW McCullough, EJ Sokell, BE O'Rourke, V Krastev, H Watanabe

Research output: Contribution to journalArticlepeer-review

Abstract

The conceptual design of a new electron beam ion trap primarily intended for the study of electron–ion interactions is outlined along with some preliminary predictions regarding its capabilities.
Original languageEnglish
Pages (from-to)230-233
Number of pages4
JournalNuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms
Volume205
DOIs
Publication statusPublished - May 2003

Keywords

  • electron impact ion trap
  • EBIT
  • electron-ion interactions

Research Beacons, Institutes and Platforms

  • Dalton Nuclear Institute

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