A new quantitative method for gunshot residue analysis by ion beam analysis.

Matthew E Christopher; Francesco S Romolo; Matteo Donghi; Roger P Webb; Christopher Jeynes; Neil I Ward; Karen J Kirkby; Melanie J Bailey; John Warmenhoven

doi:10.1039/c3an00597f

A new quantitative method for gunshot residue analysis by ion beam analysis.

Matthew E Christopher, Francesco S Romolo, Matteo Donghi, Roger P Webb, Christopher Jeynes, Neil I Ward, Karen J Kirkby, Melanie J Bailey, John Warmenhoven

Division of Cancer Sciences

Research output: Contribution to journal › Article › peer-review

Abstract

Imaging and analyzing gunshot residue (GSR) particles using the scanning electron microscope equipped with an energy dispersive X-ray spectrometer (SEM-EDS) is a standard technique that can provide important forensic evidence, but the discrimination power of this technique is limited due to low sensitivity to trace elements and difficulties in obtaining quantitative results from small particles. A new, faster method using a scanning proton microbeam and Particle Induced X-ray Emission (μ-PIXE), together with Elastic Backscattering Spectrometry (EBS) is presented for the non-destructive, quantitative analysis of the elemental composition of single GSR particles. In this study, the GSR particles were all Pb, Ba, Sb. The precision of the method is assessed. The grouping behaviour of different makes of ammunition is determined using multivariate analysis. The protocol correctly groups the cartridges studied here, with a confidence >99%, irrespective of the firearm or population of particles selected.

Original language	English
Journal	The Analyst
Volume	138
Issue number	16
DOIs	https://doi.org/10.1039/c3an00597f
Publication status	Published - 21 Aug 2013

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@article{b35b9505e6b34dab9fe9ed58299f0b44,

title = "A new quantitative method for gunshot residue analysis by ion beam analysis.",

abstract = "Imaging and analyzing gunshot residue (GSR) particles using the scanning electron microscope equipped with an energy dispersive X-ray spectrometer (SEM-EDS) is a standard technique that can provide important forensic evidence, but the discrimination power of this technique is limited due to low sensitivity to trace elements and difficulties in obtaining quantitative results from small particles. A new, faster method using a scanning proton microbeam and Particle Induced X-ray Emission (μ-PIXE), together with Elastic Backscattering Spectrometry (EBS) is presented for the non-destructive, quantitative analysis of the elemental composition of single GSR particles. In this study, the GSR particles were all Pb, Ba, Sb. The precision of the method is assessed. The grouping behaviour of different makes of ammunition is determined using multivariate analysis. The protocol correctly groups the cartridges studied here, with a confidence >99%, irrespective of the firearm or population of particles selected.",

author = "Christopher, {Matthew E} and Romolo, {Francesco S} and Matteo Donghi and Webb, {Roger P} and Christopher Jeynes and Ward, {Neil I} and Kirkby, {Karen J} and Bailey, {Melanie J} and John Warmenhoven",

year = "2013",

month = aug,

day = "21",

doi = "10.1039/c3an00597f",

language = "English",

volume = "138",

journal = "The Analyst",

issn = "0003-2654",

publisher = "Royal Society of Chemistry",

number = "16",

}

TY - JOUR

T1 - A new quantitative method for gunshot residue analysis by ion beam analysis.

AU - Christopher, Matthew E

AU - Romolo, Francesco S

AU - Donghi, Matteo

AU - Webb, Roger P

AU - Jeynes, Christopher

AU - Ward, Neil I

AU - Kirkby, Karen J

AU - Bailey, Melanie J

AU - Warmenhoven, John

PY - 2013/8/21

Y1 - 2013/8/21

N2 - Imaging and analyzing gunshot residue (GSR) particles using the scanning electron microscope equipped with an energy dispersive X-ray spectrometer (SEM-EDS) is a standard technique that can provide important forensic evidence, but the discrimination power of this technique is limited due to low sensitivity to trace elements and difficulties in obtaining quantitative results from small particles. A new, faster method using a scanning proton microbeam and Particle Induced X-ray Emission (μ-PIXE), together with Elastic Backscattering Spectrometry (EBS) is presented for the non-destructive, quantitative analysis of the elemental composition of single GSR particles. In this study, the GSR particles were all Pb, Ba, Sb. The precision of the method is assessed. The grouping behaviour of different makes of ammunition is determined using multivariate analysis. The protocol correctly groups the cartridges studied here, with a confidence >99%, irrespective of the firearm or population of particles selected.

AB - Imaging and analyzing gunshot residue (GSR) particles using the scanning electron microscope equipped with an energy dispersive X-ray spectrometer (SEM-EDS) is a standard technique that can provide important forensic evidence, but the discrimination power of this technique is limited due to low sensitivity to trace elements and difficulties in obtaining quantitative results from small particles. A new, faster method using a scanning proton microbeam and Particle Induced X-ray Emission (μ-PIXE), together with Elastic Backscattering Spectrometry (EBS) is presented for the non-destructive, quantitative analysis of the elemental composition of single GSR particles. In this study, the GSR particles were all Pb, Ba, Sb. The precision of the method is assessed. The grouping behaviour of different makes of ammunition is determined using multivariate analysis. The protocol correctly groups the cartridges studied here, with a confidence >99%, irrespective of the firearm or population of particles selected.

U2 - 10.1039/c3an00597f

DO - 10.1039/c3an00597f

M3 - Article

C2 - 23775063

SN - 0003-2654

VL - 138

JO - The Analyst

JF - The Analyst

IS - 16

ER -

A new quantitative method for gunshot residue analysis by ion beam analysis.

Abstract

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