A new Synchrotron Rapid Scanning X-ray Fluorescence (SRS-XRF) imaging station at SSRL beam line 6-2

Here we describe a new large range rapid-scan X-ray fluorescence (XRF) imaging station at the Stanford Synchrotron Radiation Lightsource (SSRL) at SLAC National Accelerator Laboratory. This station uses a continuous rapid-scan system with a scan range of 1000 x 600mm² and a load capacity of up to 20kg capable of 1-100 micron precision elemental XRF mapping and X-ray absorption spectroscopy (XAS) of a wide range of objects. The X-ray fluorescence is measured using a 4-element Hitachi Vortex ME4 silicon drift detector coupled to a Quantum Detectors Xspress3 multi-channel analyzer system. A custom system allows X-ray spot size to be changed quickly and easily via pinholes ranging from 25 - 100 microns. The instrument is located at wiggler beamline 6-2 which is equipped with two liquid nitrogen cooled monochromators – Si(111) and Si(311) – as well as collimating and focusing optics. It has an energy range of 2.3-18 keV creating K emission for elements up to zirconium, and L or M emission for all other elements. XAS can also be performed at selected sample positions within the same experiment, allowing for more detailed chemical characterization of elements of interest. Furthermore, speciation selective XRF imaging can be performed over a wide range of incident X-ray energies. User friendliness has been considered as much as possible at all stages of an experiment including versatile sample mounts, and intuitive scanning operation hardware and software. The station provides analysis capabilities for a wide range of materials and research fields including biological, medical, chemical, materials science, paleontology, geology, and cultural heritage.