A new versatile electron-beam ion trap

FJ Currell; J Asada; K Ishii; A Minoh; K Motohashi; N Nakamura; K Nishizawa; S Ohtani; K Okazaki; M Sakurai; H Shiraishi; S Tsurubuchi; H Watanabe

A new versatile electron-beam ion trap

FJ Currell, J Asada, K Ishii, A Minoh, K Motohashi, N Nakamura, K Nishizawa, S Ohtani, K Okazaki, M Sakurai, H Shiraishi, S Tsurubuchi, H Watanabe

Dalton Nuclear Institute

Research output: Contribution to journal › Article › peer-review

Abstract

We have constructed an electron-beam ion trap (EBIT) to facilitate the creation and study of highly charged ions. After a brief introduction to EBITs in general, we describe the design of the new device, highlighting its unique features. Some preliminary results are presented which demonstrate the devices capability to produce and study highly charged ions.

Original language	English
Pages (from-to)	3186-3192
Journal	Physical Society of Japan. Journal
Volume	65
Issue number	10
Publication status	Published - Oct 1996

Keywords

ion trap
EBIT
electron beam
trap
highly charged ions
X-ray source

Research Beacons, Institutes and Platforms

Dalton Nuclear Institute

Cite this

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title = "A new versatile electron-beam ion trap",

abstract = "We have constructed an electron-beam ion trap (EBIT) to facilitate the creation and study of highly charged ions. After a brief introduction to EBITs in general, we describe the design of the new device, highlighting its unique features. Some preliminary results are presented which demonstrate the devices capability to produce and study highly charged ions.",

keywords = "ion trap, EBIT, electron beam, trap, highly charged ions, X-ray source",

author = "FJ Currell and J Asada and K Ishii and A Minoh and K Motohashi and N Nakamura and K Nishizawa and S Ohtani and K Okazaki and M Sakurai and H Shiraishi and S Tsurubuchi and H Watanabe",

year = "1996",

month = oct,

language = "English",

volume = "65",

pages = "3186--3192",

journal = "Physical Society of Japan. Journal",

issn = "0031-9015",

publisher = "The Physical Society of Japan",

number = "10",

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TY - JOUR

T1 - A new versatile electron-beam ion trap

AU - Currell, FJ

AU - Asada, J

AU - Ishii, K

AU - Minoh, A

AU - Motohashi, K

AU - Nakamura, N

AU - Nishizawa, K

AU - Ohtani, S

AU - Okazaki, K

AU - Sakurai, M

AU - Shiraishi, H

AU - Tsurubuchi, S

AU - Watanabe, H

PY - 1996/10

Y1 - 1996/10

N2 - We have constructed an electron-beam ion trap (EBIT) to facilitate the creation and study of highly charged ions. After a brief introduction to EBITs in general, we describe the design of the new device, highlighting its unique features. Some preliminary results are presented which demonstrate the devices capability to produce and study highly charged ions.

AB - We have constructed an electron-beam ion trap (EBIT) to facilitate the creation and study of highly charged ions. After a brief introduction to EBITs in general, we describe the design of the new device, highlighting its unique features. Some preliminary results are presented which demonstrate the devices capability to produce and study highly charged ions.

KW - ion trap

KW - EBIT

KW - electron beam

KW - trap

KW - highly charged ions

KW - X-ray source

M3 - Article

SN - 0031-9015

VL - 65

SP - 3186

EP - 3192

JO - Physical Society of Japan. Journal

JF - Physical Society of Japan. Journal

IS - 10

ER -

A new versatile electron-beam ion trap

Abstract

Keywords

Research Beacons, Institutes and Platforms

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