A novel compensation algorithm for thickness measurement immune to lift-off variations using eddy current method

Mingyang Lu, Liyuan Yin , Anthony Peyton, Wuliang Yin

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    Abstract

    Lift-off variation causes errors in eddy current measurement of metallic plate thickness. In this paper, we have developed an algorithm which can compensate this variation and produce an index that is linked to the thickness but virtually independent of lift-off. This index, termed as the compensated peak frequency, can be obtained from the measured multi-frequency inductance spectral data using the algorithm we developed in this paper. This method has been derived through mathematical manipulation and verified by both simulation and experimental data. Accuracy in thickness measurements at different lift-off proved to be within 2%.
    Original languageEnglish
    Pages (from-to)2773-2779
    Number of pages7
    JournalIEEE Transactions on Instrumentation and Measurement
    Volume65
    Issue number12
    Early online date30 Aug 2016
    DOIs
    Publication statusPublished - Dec 2016

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