A rapid two-dimensional data collection system for the study of ferroelectric materials under external applied electric fields

Tikhon Vergentev, Iurii Bronwald, Dmitry Chernyshov, Semen Gorfman, Stephanie H M Ryding, Paul Thompson, Robert J. Cernik*

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Synchrotron X-rays on the Swiss Norwegian Beamline and BM28 (XMaS) at the ESRF have been used to record the diffraction response of the PMN-PT relaxor piezoelectric 67% Pb(Mg1/3Nb2/3)O3-33% PbTiO3 as a function of externally applied electric field. A DC field in the range 0-18Kv cm-1 was applied along the [001] pseudo-cubic direction using a specially designed sample cell for in situ single-crystal diffraction experiments. The cell allowed data to be collected on a Pilatus 2M area detector in a large volume of reciprocal space using transmission geometry. The data showed good agreement with a twinned single-phase monoclinic structure model. The results from the area detector were compared with previous Bragg peak mapping using variable electric fields and a single detector where the structural model was ambiguous. The coverage of a significantly larger section of reciprocal space facilitated by the area detector allowed precise phase analysis.The diffraction response of the PMN-PT relaxor piezoelectric 67% Pb(Mg1/3Nb2/3)O3-33% PbTiO3 has been recorded as a function of externally applied electric field. The DC field was applied using a specially designed sample cell for in situ single-crystal diffraction experiments. The coverage of a significantly large section of reciprocal space allowed precise phase analysis.

    Original languageEnglish
    Pages (from-to)1501-1507
    Number of pages7
    JournalJournal of Applied Crystallography
    Volume49
    Issue number5
    DOIs
    Publication statusPublished - 31 Oct 2016

    Keywords

    • area detectors
    • diffuse scattering
    • ferroelectricity
    • in situ two-dimensional X-ray single-crystal diffraction
    • phase transitions
    • piezoelectricity
    • PMN-PT
    • synchrotron X-rays

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