A simple method of modelling the C-tV profiles of high-low junctions and heterojunctions

M. Missous*, E. H. Rhoderick

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

A simple method of modelling the C-V profiles of high-low junctions and heterojunctions is described in which the integration of Poisson's equation proceeds from the interior towards the surface, instead of from the surface inwards as is usually the case. No iteration is necessary, so that a considerable saving in time is achieved and no stability problems arise. A typical program takes about 30 min to run on a desk-top computer.

Original languageEnglish
Pages (from-to)233-237
Number of pages5
JournalSolid State Electronics
Volume28
Issue number3
DOIs
Publication statusPublished - Mar 1985

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