A study of in-situ grain size observation of Sn-0.7 Cu using FIB/SEM

XL Zhong, Philip Withers, MG Burke, SJ Haigh, M Gupta, GE Thompson

Research output: Contribution to journalConference articlepeer-review

12 Downloads (Pure)
Original languageEnglish
JournalEuropean Microscopy Congress
Publication statusPublished - 2012

Cite this