| Original language | English |
|---|---|
| Journal | European Microscopy Congress |
| Publication status | Published - 2012 |
A study of in-situ grain size observation of Sn-0.7 Cu using FIB/SEM
XL Zhong, Philip Withers, MG Burke, SJ Haigh, M Gupta, GE Thompson
Research output: Contribution to journal › Conference article › peer-review
19
Downloads
(Pure)