A study of the effect of strain and Ge content on F+ implantation induced damage in SiGe investigated by in-situ Transmission Electron Microscopy

Huda El Mubarek, A. S. Gandy, M. Alraimi, H. A. W. El Mubarek

    Research output: Contribution to conferenceOther

    Original languageEnglish
    Publication statusPublished - May 2011
    EventEuropean Materials Research Society Spring Meeting 2012 - Nice France
    Duration: 9 May 201113 May 2011

    Conference

    ConferenceEuropean Materials Research Society Spring Meeting 2012
    CityNice France
    Period9/05/1113/05/11

    Cite this