A surface X-ray diffraction study of Ni(1 1 0)c(2 × 2)-CN

B. G. Daniels; F. Schedin; O. Bikondoa; G. Thornton; R. Lindsay

doi:10.1016/j.susc.2004.09.018

A surface X-ray diffraction study of Ni(1 1 0)c(2 × 2)-CN

B. G. Daniels, F. Schedin, O. Bikondoa, G. Thornton, R. Lindsay

Research output: Contribution to journal › Article › peer-review

Abstract

Surface X-ray diffraction (SXRD) has been employed to elucidate the geometry of Ni(1 1 0)c(2 × 2)-CN. It is concluded that the CN overlayer induces an expansion of the outermost Ni layer spacing of 11 ± 2%, relative to bulk-termination. In contrast to an earlier hypothesis, however, no substantive evidence for a significant substrate reconstruction is found. These results are in accord with previously published quantitative structure determinations of this system. © 2004 Elsevier B.V. All rights reserved.

Original language	English
Pages (from-to)	433-438
Number of pages	5
Journal	Surface Science
Volume	572
Issue number	2-3
DOIs	https://doi.org/10.1016/j.susc.2004.09.018
Publication status	Published - 20 Nov 2004

Keywords

And reflection
Chemisorption
Cyanogen
Diffraction
Low index single crystal surfaces
Nickel
Surface relaxation and reconstruction
X-ray scattering

Access to Document

10.1016/j.susc.2004.09.018

Cite this

@article{51c3d599866a439196565d68a3ef610b,

title = "A surface X-ray diffraction study of Ni(1 1 0)c(2 × 2)-CN",

abstract = "Surface X-ray diffraction (SXRD) has been employed to elucidate the geometry of Ni(1 1 0)c(2 × 2)-CN. It is concluded that the CN overlayer induces an expansion of the outermost Ni layer spacing of 11 ± 2\%, relative to bulk-termination. In contrast to an earlier hypothesis, however, no substantive evidence for a significant substrate reconstruction is found. These results are in accord with previously published quantitative structure determinations of this system. {\textcopyright} 2004 Elsevier B.V. All rights reserved.",

keywords = "And reflection, Chemisorption, Cyanogen, Diffraction, Low index single crystal surfaces, Nickel, Surface relaxation and reconstruction, X-ray scattering",

author = "Daniels, \{B. G.\} and F. Schedin and O. Bikondoa and G. Thornton and R. Lindsay",

year = "2004",

month = nov,

day = "20",

doi = "10.1016/j.susc.2004.09.018",

language = "English",

volume = "572",

pages = "433--438",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier BV",

number = "2-3",

}

TY - JOUR

T1 - A surface X-ray diffraction study of Ni(1 1 0)c(2 × 2)-CN

AU - Daniels, B. G.

AU - Schedin, F.

AU - Bikondoa, O.

AU - Thornton, G.

AU - Lindsay, R.

PY - 2004/11/20

Y1 - 2004/11/20

N2 - Surface X-ray diffraction (SXRD) has been employed to elucidate the geometry of Ni(1 1 0)c(2 × 2)-CN. It is concluded that the CN overlayer induces an expansion of the outermost Ni layer spacing of 11 ± 2%, relative to bulk-termination. In contrast to an earlier hypothesis, however, no substantive evidence for a significant substrate reconstruction is found. These results are in accord with previously published quantitative structure determinations of this system. © 2004 Elsevier B.V. All rights reserved.

AB - Surface X-ray diffraction (SXRD) has been employed to elucidate the geometry of Ni(1 1 0)c(2 × 2)-CN. It is concluded that the CN overlayer induces an expansion of the outermost Ni layer spacing of 11 ± 2%, relative to bulk-termination. In contrast to an earlier hypothesis, however, no substantive evidence for a significant substrate reconstruction is found. These results are in accord with previously published quantitative structure determinations of this system. © 2004 Elsevier B.V. All rights reserved.

KW - And reflection

KW - Chemisorption

KW - Cyanogen

KW - Diffraction

KW - Low index single crystal surfaces

KW - Nickel

KW - Surface relaxation and reconstruction

KW - X-ray scattering

UR - https://www.scopus.com/pages/publications/9644294401

U2 - 10.1016/j.susc.2004.09.018

DO - 10.1016/j.susc.2004.09.018

M3 - Article

SN - 0039-6028

VL - 572

SP - 433

EP - 438

JO - Surface Science

JF - Surface Science

IS - 2-3

ER -

A surface X-ray diffraction study of Ni(1 1 0)c(2 × 2)-CN

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this