A transparent two-dimensional in situ beam-position and profile monitor for synchrotron X-ray beamlines

Nicholas R. Kyele, Klaas Decanniere, Roelof G. Van Silfhout

    Research output: Contribution to journalArticlepeer-review

    Abstract

    A compact, inexpensive and easy-to-construct two-dimensional in situ beam-position and profile monitor for synchrotron X-ray beamlines is presented. The device is based on the collection of spatially resolved scattered radiation from a polyimide foil. The X-ray beam passes through a foil placed in the path of the beam, which absorbs no more than 3% of the beam at 12 keV. The scattered radiation is collected at an angle of 90° through a collimator located below the foil onto a CCD sensor. The device was tested on bending-magnet beamline BM26 at the ESRF synchrotron radiation source and has a positional sensitivity better than 10 um with a large working range of 25 mm × 25 mm. Although the device is optimized for use in the range 10-12 keV, it can easily be modified for use with higher-energy beams by using a suitably chosen scattering foil. © 2005 International Union of Crystallography Printed in Great Britain - all rights reserved.
    Original languageEnglish
    Pages (from-to)800-806
    Number of pages6
    JournalJournal of Synchrotron Radiation
    Volume12
    Issue number6
    DOIs
    Publication statusPublished - Nov 2005

    Keywords

    • Beam-position monitor
    • Beam-profile monitor
    • CCD-based
    • Detectors
    • X-rays

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