A universal scaling law for the strength of metal micropillars and nanowires

R. Dou, B. Derby

    Research output: Contribution to journalArticlepeer-review

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    Abstract

    The yield strength of sub-micron single-crystal metal pillars and wires increases with decreasing pillar diameter. Here, we show that the yield stress (resolved onto a slip system), σrss, scaled by shear modulus, μ, and the diameter, d, scaled by Burgers vector, b, shows the following universal correlation: σrss / μ = A (d / b)m; for face-centred cubic (fcc) metals A = 0.71 and m = -0.66. Data for Mo and a Mo alloy are found to approximately obey the fcc correlation, despite having a different crystal structure. © 2009 Acta Materialia Inc.
    Original languageEnglish
    Pages (from-to)524-527
    Number of pages3
    JournalScripta Materialia
    Volume61
    Issue number5
    DOIs
    Publication statusPublished - Sept 2009

    Keywords

    • Nanocrystalline materials
    • Plastic deformation
    • Size effect

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