Aberration-corrected imaging in conventional transmission electron microscopy and scanning transmission electron microscopy

Angus I Kirkland, Peter D Nellist, LYS Chang, SJ Haigh

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	283-325
Number of pages	43
Journal	Advances in Imaging and Electron Physics
Volume	153
Publication status	Published - 2009

Cite this

@article{67ea7343de214af0bfb919cbf17a1e33,

title = "Aberration-corrected imaging in conventional transmission electron microscopy and scanning transmission electron microscopy",

author = "Kirkland, {Angus I} and Nellist, {Peter D} and LYS Chang and SJ Haigh",

year = "2009",

language = "English",

volume = "153",

pages = "283--325",

journal = "Advances in Imaging and Electron Physics",

publisher = "Elsevier BV",

}

TY - JOUR

T1 - Aberration-corrected imaging in conventional transmission electron microscopy and scanning transmission electron microscopy

AU - Kirkland, Angus I

AU - Nellist, Peter D

AU - Chang, LYS

AU - Haigh, SJ

PY - 2009

Y1 - 2009

M3 - Article

VL - 153

SP - 283

EP - 325

JO - Advances in Imaging and Electron Physics

JF - Advances in Imaging and Electron Physics

ER -