@inbook{12ede86b5a6d46f8b4f4388850c941ef,
title = "Aberration-Corrected Imaging in CTEM",
keywords = "Aberration measurement-practical aberration correction, and aberration measurement accuracy, Aberration-corrected imaging-in Conventional Transmission Electron Microscope (CTEM), Corrected imaging conditions-and high resolution CTEM images, contrast reversals and delocalisation, CTEM instruments, fitted with beam scan coils-providing CTEM and STEM imaging modes, Electron optical configuration of CTEM-different to that of STEM, Imaging theory-for a perfect lens, JEOL 2200MCO column fitted-imaging (CTEM) and STEM (probe forming) aberration-corrector elements, Optics, and instrumentation-for aberration-corrected CTEM, Phase contrast imaging difficulties, in CTEM-phase change, objective lens oscillating, Wave aberration function-for uncorrected CTEM, effects of spherical aberration",
author = "Haigh, {Sarah J.} and Kirkland, {Angus I.}",
year = "2011",
month = jul,
day = "26",
doi = "10.1002/9781119978848.ch9",
language = "English",
pages = "241--261",
booktitle = "Aberration-Corrected Analytical Transmission Electron Microscopy|Aberration-Corrected Anal. Transmission Electron Microscopy",
publisher = "John Wiley & Sons Ltd",
address = "United Kingdom",
}