Aberration correction can be achieved using either direct electron optical correction or indirect image restoration. In the past focal series restoration has been applied to aberration corrected images in order to improve the quality of aberration correction and retrieve the complex specimen exit wavefunction. Image restoration can also be performed from a number of images with differing illumination tilts (a tilt series) instead of the more common focal series datasets where only the defocus value is varied. Here we apply tilt series image restoration to aberration corrected images and discuss the advantages of this approach. Preliminary results demonstrate the potential of this technique to provide interpretable structural information at resolutions beyond the axial information limit of the microscope. © 2008 IOP Publishing Ltd.
|Journal||Journal of Physics: Conference Series|
|Publication status||Published - 2008|