Aberration Corrected Transmission Electron Microscopy and the Characterisation of Nanomaterials

S Stoter L P Haigh

Aberration Corrected Transmission Electron Microscopy and the Characterisation of Nanomaterials

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Original language	English
Title of host publication	NanoAfrica 2009, 3rd International Conference on Nanoscience and Nanotechnology, CSIR International Convention Centre, Pretoria, South Africa, February 1- 4, 2009
Publication status	Published - 2009

Cite this

@inbook{2f56fe5acfb941088348fa1ce49c4eab,

title = "Aberration Corrected Transmission Electron Microscopy and the Characterisation of Nanomaterials",

author = "Haigh, {S Stoter L P}",

year = "2009",

language = "English",

booktitle = "NanoAfrica 2009, 3rd International Conference on Nanoscience and Nanotechnology, CSIR International Convention Centre, Pretoria, South Africa, February 1- 4, 2009",

}

Aberration Corrected Transmission Electron Microscopy and the Characterisation of Nanomaterials. / Haigh, S Stoter L P.
NanoAfrica 2009, 3rd International Conference on Nanoscience and Nanotechnology, CSIR International Convention Centre, Pretoria, South Africa, February 1- 4, 2009 . 2009.

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review