Abstract
We present a new tool and measurement protocol based on Atomic Force Microscopy for the AC and DC electrical characterization of biological samples at the nanoscale. The new developments allow performing a variety of electrical measurements (DC conductivity, A C small signal impedance) both in spectroscopic mode (i.e. in a single point) as well as in imaging mode (i.e. by providing a map of the electrical properties with nanometric spatial resolution) with minimum sample damage. Successful test measurements have been carried out on Purple Membrane.
| Original language | English |
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| Article number | 037 |
| Pages (from-to) | 185-189 |
| Number of pages | 5 |
| Journal | Journal of Physics: Conference Series |
| Volume | 61 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Apr 2007 |