Advanced Analytical Electron Microscopy: New Perspectives on Real Materials

MG Burke, SJ Haigh, JJH Lim, A Janssen

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	489-490
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	21
Issue number	S3
DOIs	https://doi.org/DOI:10.1017/S1431927615003244
Publication status	Published - 2015

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title = "Advanced Analytical Electron Microscopy: New Perspectives on Real Materials",

author = "MG Burke and SJ Haigh and JJH Lim and A Janssen",

year = "2015",

doi = "DOI:10.1017/S1431927615003244",

language = "English",

volume = "21",

pages = "489--490",

journal = "Microscopy and Microanalysis",

issn = "1435-8115",

publisher = "Cambridge University Press",

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T1 - Advanced Analytical Electron Microscopy: New Perspectives on Real Materials

AU - Burke, MG

AU - Haigh, SJ

AU - Lim, JJH

AU - Janssen, A

PY - 2015

Y1 - 2015

U2 - DOI:10.1017/S1431927615003244

DO - DOI:10.1017/S1431927615003244

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VL - 21

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EP - 490

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

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