An in-situ synchrotron X-ray diffraction tomography study of crystallization and preferred crystal orientation in a stirred reactor

SDM Jacques, K Pile, P Barnes, X Lai, K J Roberts, R A Williams

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)395-397
    Number of pages3
    JournalCrystal Growth and Design
    Issue number2
    Publication statusPublished - 2005

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