Analysis of defects at the interface between high-k thin films and (1 0 0) silicon

B J Jones, R C Barklie

    Research output: Contribution to journal › Article › peer-review

    Fingerprint

    Dive into the research topics of 'Analysis of defects at the interface between high-k thin films and (1 0 0) silicon'. Together they form a unique fingerprint.

    Chemistry

    Material Science