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Dive into the research topics of 'Analysis of thin AlN carrier exclusion layers in AlGaN/GaN microwave heterojunction field-effect transistors'. Together they form a unique fingerprint.- Sort by
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R. S. Balmer*, K. P. Hilton, K. J. Nash, M. J. Uren, D. J. Wallis, D. Lee, A. Wells, M. Missous, T. Martin
Research output: Contribution to journal › Article › peer-review