Analysis of thin and thick Films

Philippe Le Coustumer; Patrick Chapon; Agnès Tempez; Yuriy Popov; George Thompson; Igor Molchan; Nicolas Trigoulet; Peter Skeldon; Antonino Licciardello; Nunzio Tuccitto; Ivan Delfanti; Katrin Fuhrer; Marc Gonin; James Whitby; Markus Hohl; Christian Tanner; Nerea Bordel Garcia; Lara Lobo Revilla; Jorge Pisonero; Rosario Pereiro; Cristina Gonzalez Gago; Alfredo Sanz Medel; Mihai Ganciu Petcu; Ani Surmeian; Constantin Diplasu; Andreea Groza; Norbert Jakubowski; Roland Dorka; Stela Canulescu; Johann Michler; Philippe Belenguer; Thomas Nelis; Abdellatif Zahri; Philippe Guillot; Laurent Thérèse; Arnaud Littner; Richard Vaux; Julien Malherbe; Frédéric Huneau; Fred Stevie; Hugues François-Saint-Cyr

doi:10.1002/9781118180730.ch41

Analysis of thin and thick Films

Philippe Le Coustumer, Patrick Chapon, Agnès Tempez, Yuriy Popov, George Thompson, Igor Molchan, Nicolas Trigoulet, Peter Skeldon, Antonino Licciardello, Nunzio Tuccitto, Ivan Delfanti, Katrin Fuhrer, Marc Gonin, James Whitby, Markus Hohl, Christian Tanner, Nerea Bordel Garcia, Lara Lobo Revilla, Jorge Pisonero, Rosario PereiroCristina Gonzalez Gago, Alfredo Sanz Medel, Mihai Ganciu Petcu, Ani Surmeian, Constantin Diplasu, Andreea Groza, Norbert Jakubowski, Roland Dorka, Stela Canulescu, Johann Michler, Philippe Belenguer, Thomas Nelis, Abdellatif Zahri, Philippe Guillot, Laurent Thérèse, Arnaud Littner, Richard Vaux, Julien Malherbe, Frédéric Huneau, Fred Stevie, Hugues François-Saint-Cyr

Research output: Chapter in Book/Conference proceeding › Chapter

Original language	English
Title of host publication	Mass Spectrometry Handbook\|Mass Spectrom. Handb.
Publisher	John Wiley & Sons Ltd
Pages	943-959
Number of pages	16
DOIs	https://doi.org/10.1002/9781118180730.ch41
Publication status	Published - 21 May 2012

Keywords

Ionization source with sensitive MS, flexible analytical platforms for layered material
Major MS techniques in thin/thick film applications
MS-based techniques and thin and thick layer chemical information
Thin and thick film analysis, surface analysis and features
Time of sputtering/speed of acquisition trade-off

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10.1002/9781118180730.ch41

Light Alloys towards environmentally sustainable transport: 2nd generation solutions for Advanced Metallic Systems ( LATEST 2 )
Thompson, G. (PI), Bate, P. (CoI), Prangnell, P. (CoI), Preuss, M. (CoI), Quinta Da Fonseca, J. (CoI), Robson, J. (CoI), Skeldon, P. (CoI) & Zhou, X. (CoI)
1/02/10 → 31/07/15
Project: Research

Cite this

Coustumer, P. L., Chapon, P., Tempez, A., Popov, Y., Thompson, G., Molchan, I., Trigoulet, N., Skeldon, P., Licciardello, A., Tuccitto, N., Delfanti, I., Fuhrer, K., Gonin, M., Whitby, J., Hohl, M., Tanner, C., Garcia, N. B., Revilla, L. L., Pisonero, J., ... François-Saint-Cyr, H. (2012). Analysis of thin and thick Films. In Mass Spectrometry Handbook|Mass Spectrom. Handb. (pp. 943-959). John Wiley & Sons Ltd. https://doi.org/10.1002/9781118180730.ch41

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title = "Analysis of thin and thick Films",

keywords = "Ionization source with sensitive MS, flexible analytical platforms for layered material, Major MS techniques in thin/thick film applications, MS-based techniques and thin and thick layer chemical information, Thin and thick film analysis, surface analysis and features, Time of sputtering/speed of acquisition trade-off",

author = "Coustumer, {Philippe Le} and Patrick Chapon and Agn{\`e}s Tempez and Yuriy Popov and George Thompson and Igor Molchan and Nicolas Trigoulet and Peter Skeldon and Antonino Licciardello and Nunzio Tuccitto and Ivan Delfanti and Katrin Fuhrer and Marc Gonin and James Whitby and Markus Hohl and Christian Tanner and Garcia, {Nerea Bordel} and Revilla, {Lara Lobo} and Jorge Pisonero and Rosario Pereiro and Gago, {Cristina Gonzalez} and Medel, {Alfredo Sanz} and Petcu, {Mihai Ganciu} and Ani Surmeian and Constantin Diplasu and Andreea Groza and Norbert Jakubowski and Roland Dorka and Stela Canulescu and Johann Michler and Philippe Belenguer and Thomas Nelis and Abdellatif Zahri and Philippe Guillot and Laurent Th{\'e}r{\`e}se and Arnaud Littner and Richard Vaux and Julien Malherbe and Fr{\'e}d{\'e}ric Huneau and Fred Stevie and Hugues Fran{\c c}ois-Saint-Cyr",

year = "2012",

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day = "21",

doi = "10.1002/9781118180730.ch41",

language = "English",

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Coustumer, PL, Chapon, P, Tempez, A, Popov, Y, Thompson, G, Molchan, I, Trigoulet, N, Skeldon, P, Licciardello, A, Tuccitto, N, Delfanti, I, Fuhrer, K, Gonin, M, Whitby, J, Hohl, M, Tanner, C, Garcia, NB, Revilla, LL, Pisonero, J, Pereiro, R, Gago, CG, Medel, AS, Petcu, MG, Surmeian, A, Diplasu, C, Groza, A, Jakubowski, N, Dorka, R, Canulescu, S, Michler, J, Belenguer, P, Nelis, T, Zahri, A, Guillot, P, Thérèse, L, Littner, A, Vaux, R, Malherbe, J, Huneau, F, Stevie, F & François-Saint-Cyr, H 2012, Analysis of thin and thick Films. in Mass Spectrometry Handbook|Mass Spectrom. Handb.. John Wiley & Sons Ltd, pp. 943-959. https://doi.org/10.1002/9781118180730.ch41

TY - CHAP

T1 - Analysis of thin and thick Films

AU - Coustumer, Philippe Le

AU - Chapon, Patrick

AU - Tempez, Agnès

AU - Popov, Yuriy

AU - Thompson, George

AU - Molchan, Igor

AU - Trigoulet, Nicolas

AU - Skeldon, Peter

AU - Licciardello, Antonino

AU - Tuccitto, Nunzio

AU - Delfanti, Ivan

AU - Fuhrer, Katrin

AU - Gonin, Marc

AU - Whitby, James

AU - Hohl, Markus

AU - Tanner, Christian

AU - Garcia, Nerea Bordel

AU - Revilla, Lara Lobo

AU - Pisonero, Jorge

AU - Pereiro, Rosario

AU - Gago, Cristina Gonzalez

AU - Medel, Alfredo Sanz

AU - Petcu, Mihai Ganciu

AU - Surmeian, Ani

AU - Diplasu, Constantin

AU - Groza, Andreea

AU - Jakubowski, Norbert

AU - Dorka, Roland

AU - Canulescu, Stela

AU - Michler, Johann

AU - Belenguer, Philippe

AU - Nelis, Thomas

AU - Zahri, Abdellatif

AU - Guillot, Philippe

AU - Thérèse, Laurent

AU - Littner, Arnaud

AU - Vaux, Richard

AU - Malherbe, Julien

AU - Huneau, Frédéric

AU - Stevie, Fred

AU - François-Saint-Cyr, Hugues

PY - 2012/5/21

Y1 - 2012/5/21

KW - Ionization source with sensitive MS, flexible analytical platforms for layered material

KW - Major MS techniques in thin/thick film applications

KW - MS-based techniques and thin and thick layer chemical information

KW - Thin and thick film analysis, surface analysis and features

KW - Time of sputtering/speed of acquisition trade-off

U2 - 10.1002/9781118180730.ch41

DO - 10.1002/9781118180730.ch41

M3 - Chapter

SP - 943

EP - 959

BT - Mass Spectrometry Handbook|Mass Spectrom. Handb.

PB - John Wiley & Sons Ltd

ER -

Analysis of thin and thick Films

Keywords

Access to Document

Projects

Light Alloys towards environmentally sustainable transport: 2nd generation solutions for Advanced Metallic Systems ( LATEST 2 )

Cite this