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Abstract
Original language | English |
---|---|
Article number | 5536 |
Journal | Sensors |
Volume | 21 |
Issue number | 16 |
DOIs | |
Publication status | Published - 17 Aug 2021 |
Keywords
- Depth measurement
- Eddy current driver–pickup sensor
- Non‐destructive testing
- Surface crack
- Thin‐skin regime
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Dive into the research topics of 'Analysis of Tilt Effect on Notch Depth Profiling Using Thin-Skin Regime of Driver-Pickup Eddy-Current Sensor'. Together they form a unique fingerprint.Projects
- 1 Active
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Electromagnetic Sensing Group
Peyton, A. (PI), Fletcher, A. (Researcher), Daniels, D. (CoI), Conniffe, D. (PGR student), Podd, F. (PI), Davidson, J. (Researcher), Anderson, J. (Support team), Wilson, J. (Researcher), Marsh, L. (PI), O'Toole, M. (PI), Watson, S. (PGR student), Yin, W. (PI), Regan, A. (PGR student), Williams, K. (Researcher), Rana, S. (Researcher), Khalil, K. (PGR student), Hills, D. (PGR student), Whyte, C. (PGR student), Wang, C. (PGR student), Hodgskin-Brown, R. (PGR student), Dadkhahtehrani, F. (PGR student), Forster, S. (PGR student), Zhu, F. (PGR student), Yu, K. (PGR student), Xiong, L. (PGR student), Lu, T. (PGR student), Zhang, L. (PGR student), Lyu, R. (PGR student), Zhu, R. (PGR student), She, S. (PGR student), Meng, T. (PGR student), Pang, X. (PGR student), Zheng, X. (PGR student), Bai, X. (PGR student), Zou, X. (PGR student), Ding, Y. (PGR student), Shao, Y. (PGR student), Xia, Z. (PGR student), Zhang, Z. (PGR student), Khangerey, R. (PGR student) & Lawless, B. (Researcher)
1/10/04 → …
Project: Research