Analysis of VEEL spectra of diamond using a dedicated STEM: Isolation of erenkov loss contributions

J. W L Eccles, U. Bangert

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    The analysis of multiple EEL (electron energy-loss) spectra often requires normalisation of data to eliminate, for example, relative variations in thickness. In this case, data would only be reliable if it were normalised to a region in the spectrum, where the intensity varied with thickness alone. This raises the question of where an appropriate region is located, from which to extract the normalisation constants. The introduction of structure into the spectrum at certain thicknesses, such as energy lost via Cerenkov radiation emission, are clear regions to avoid. Identifying energy-loss contributions in the valence band region will provide further clarification for this process. © 2008 IOP Publishing Ltd.
    Original languageEnglish
    Title of host publicationJournal of Physics: Conference Series|J. Phys. Conf. Ser.
    PublisherIOP Publishing Ltd
    Volume126
    DOIs
    Publication statusPublished - 2008
    EventElectron Microscopy and Analysis Group Conference - Glasgow, SCOTLAND
    Duration: 3 Sept 20077 Sept 2007

    Conference

    ConferenceElectron Microscopy and Analysis Group Conference
    CityGlasgow, SCOTLAND
    Period3/09/077/09/07

    Keywords

    • Nanoscience & Nanotechnology
    • Materials Science, Multidisciplinary
    • Physics, Applied

    Fingerprint

    Dive into the research topics of 'Analysis of VEEL spectra of diamond using a dedicated STEM: Isolation of erenkov loss contributions'. Together they form a unique fingerprint.

    Cite this