Application of Dual Beam FIB to the metrology of nanostructured photovoltaic devices

G. McMahon, J. Rybczynski, Y. Wang, Y. Gao, N. Argenti, K. Kempa, Z. F. Ren, M. J. Naughton

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1392-1393
Journal	Microscopy and Microanalysis
Volume	15
Issue number	(Suppl 2)
DOIs	https://doi.org/10.1017/S1431927609097244
Publication status	Published - Jul 2009

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title = "Application of Dual Beam FIB to the metrology of nanostructured photovoltaic devices",

author = "G. McMahon and J. Rybczynski and Y. Wang and Y. Gao and N. Argenti and K. Kempa and Ren, {Z. F.} and Naughton, {M. J.}",

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AU - Rybczynski, J.

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AU - Argenti, N.

AU - Kempa, K.

AU - Ren, Z. F.

AU - Naughton, M. J.

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