Application of Response Surface Methodology to laser-induced breakdown spectroscopy: Influences of hardware configuration

J. S. Cowpe; J. S. Astin; R. D. Pilkington; A. E. Hill

doi:10.1016/j.sab.2007.10.035

Application of Response Surface Methodology to laser-induced breakdown spectroscopy: Influences of hardware configuration

J. S. Cowpe, J. S. Astin, R. D. Pilkington, A. E. Hill

Research output: Contribution to journal › Article › peer-review

Abstract

Response Surface Methodology (RSM) was employed to optimize LIBS analysis of single crystal silicon at atmospheric pressure and under vacuum conditions (pressure ∼ 10- 6 mbar). Multivariate analysis software (StatGraphics 5.1) was used to design and analyze several multi-level, full factorial RSM experiments. A Quality Factor (QF) was conceived as the response parameter for the experiments, representing the quality of the LIBS spectrum captured for a given hardware configuration. The QF enabled the hardware configuration to be adjusted so that a best compromise between resolution, signal intensity and signal noise could be achieved. The effect on the QF of simultaneously adjusting spectrometer gain, gate delay, gate width, lens position and spectrometer slit width was investigated, and the conditions yielding the best QF determined. © 2007 Elsevier B.V. All rights reserved.

Original language	English
Pages (from-to)	1335-1342
Number of pages	7
Journal	Spectrochimica Acta - Part B : Atomic Spectroscopy
Volume	62
Issue number	12
DOIs	https://doi.org/10.1016/j.sab.2007.10.035
Publication status	Published - Dec 2007

Keywords

Hardware
LIBS
Optimization
Response Surface Methodology
Silicon

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10.1016/j.sab.2007.10.035

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title = "Application of Response Surface Methodology to laser-induced breakdown spectroscopy: Influences of hardware configuration",

abstract = "Response Surface Methodology (RSM) was employed to optimize LIBS analysis of single crystal silicon at atmospheric pressure and under vacuum conditions (pressure ∼ 10- 6 mbar). Multivariate analysis software (StatGraphics 5.1) was used to design and analyze several multi-level, full factorial RSM experiments. A Quality Factor (QF) was conceived as the response parameter for the experiments, representing the quality of the LIBS spectrum captured for a given hardware configuration. The QF enabled the hardware configuration to be adjusted so that a best compromise between resolution, signal intensity and signal noise could be achieved. The effect on the QF of simultaneously adjusting spectrometer gain, gate delay, gate width, lens position and spectrometer slit width was investigated, and the conditions yielding the best QF determined. {\textcopyright} 2007 Elsevier B.V. All rights reserved.",

keywords = "Hardware, LIBS, Optimization, Response Surface Methodology, Silicon",

author = "Cowpe, {J. S.} and Astin, {J. S.} and Pilkington, {R. D.} and Hill, {A. E.}",

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journal = "Spectrochimica Acta - Part B : Atomic Spectroscopy",

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T1 - Application of Response Surface Methodology to laser-induced breakdown spectroscopy: Influences of hardware configuration

AU - Cowpe, J. S.

AU - Astin, J. S.

AU - Pilkington, R. D.

AU - Hill, A. E.

PY - 2007/12

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AB - Response Surface Methodology (RSM) was employed to optimize LIBS analysis of single crystal silicon at atmospheric pressure and under vacuum conditions (pressure ∼ 10- 6 mbar). Multivariate analysis software (StatGraphics 5.1) was used to design and analyze several multi-level, full factorial RSM experiments. A Quality Factor (QF) was conceived as the response parameter for the experiments, representing the quality of the LIBS spectrum captured for a given hardware configuration. The QF enabled the hardware configuration to be adjusted so that a best compromise between resolution, signal intensity and signal noise could be achieved. The effect on the QF of simultaneously adjusting spectrometer gain, gate delay, gate width, lens position and spectrometer slit width was investigated, and the conditions yielding the best QF determined. © 2007 Elsevier B.V. All rights reserved.

KW - Hardware

KW - LIBS

KW - Optimization

KW - Response Surface Methodology

KW - Silicon

U2 - 10.1016/j.sab.2007.10.035

DO - 10.1016/j.sab.2007.10.035

M3 - Article

SN - 0584-8547

VL - 62

SP - 1335

EP - 1342

JO - Spectrochimica Acta - Part B : Atomic Spectroscopy

JF - Spectrochimica Acta - Part B : Atomic Spectroscopy

IS - 12

ER -

Application of Response Surface Methodology to laser-induced breakdown spectroscopy: Influences of hardware configuration

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Keywords

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