Application to argon ions of a new technique to measure the two-electron contribution to the ground state energy of helium-like ions

F.J Currell, J. Asada, T.V Back, C.Z Dong, H.S Margolis, Nobuyuki Nakamura, S. Ohtani, J.D Silver, H. Watanabe

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Abstract

We have measured the two-electron contribution of the ground state energy of helium-like argon ions using an electron beam ion trap (EBIT). A two-dimensional map was measured showing the intensity of x-rays from the trap passing through a krypton-filled absorption cell. The independent axes of this map were electron beam energy and x-ray energy. From this map, we deduced the two-electron contribution of the ground state of helium-like argon. This experimentally determined value (312.4 ± 9.5 eV) was found to be in good agreement with our calculated values (about 303.35 eV) and previous calculations of the same quantity. Based on these measurements, we have shown that a ten-day absorption spectroscopy run with a super-EBIT should be sufficient to provide a new benchmark value for the two-electron contribution to the ground state of helium-like krypton. Such a measurement would then constitute a test of quantum electrodynamics to second order.
Original languageEnglish
Pages (from-to)727-734
Number of pages8
JournalJOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS
Volume33
Issue number4
Publication statusPublished - 28 Feb 2000

Research Beacons, Institutes and Platforms

  • Dalton Nuclear Institute

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