Applications of a novel FIB-SIMS instrument in SIMS image depth profiling

Gregory McMahon, Jocho Nxumalo, Michael W Phaneuf

    Research output: Contribution to journalArticlepeer-review

    Original languageUndefined
    Pages (from-to)1212-1213
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume8
    Issue numberS02
    Publication statusPublished - 2002

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