Original language | Undefined |
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Pages (from-to) | 1212-1213 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 8 |
Issue number | S02 |
Publication status | Published - 2002 |
Applications of a novel FIB-SIMS instrument in SIMS image depth profiling
Gregory McMahon, Jocho Nxumalo, Michael W Phaneuf
Research output: Contribution to journal › Article › peer-review