Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science

Angus Kirkland, Judy Kim, Jamie Warner, Konstantin Borisenko, Sarah Haigh, Neil Young, Peng Wang, Peter Nellist

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	930-931
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	S3
DOIs	https://doi.org/10.1017/S1431927614006370
Publication status	Published - 2014

Access to Document

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title = "Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science",

author = "Angus Kirkland and Judy Kim and Jamie Warner and Konstantin Borisenko and Sarah Haigh and Neil Young and Peng Wang and Peter Nellist",

year = "2014",

doi = "10.1017/S1431927614006370",

language = "English",

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T1 - Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science

AU - Kirkland, Angus

AU - Kim, Judy

AU - Warner, Jamie

AU - Borisenko, Konstantin

AU - Haigh, Sarah

AU - Young, Neil

AU - Wang, Peng

AU - Nellist, Peter

PY - 2014

Y1 - 2014

UR - https://www.scopus.com/pages/publications/84927933962

U2 - 10.1017/S1431927614006370

DO - 10.1017/S1431927614006370

M3 - Article

SN - 1435-8115

VL - 20

SP - 930

EP - 931

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S3

ER -