| Original language | English |
|---|---|
| Pages (from-to) | 530-531 |
| Number of pages | 2 |
| Journal | MICROSCOPY AND MICROANALYSIS-NEW YORK- |
| Volume | 6 |
| Issue number | 2 |
| Publication status | Published - 2000 |
Assessment of Deformation Using the Focused Ion Beam Technique
MG Burke, P Duda, G Botton, MW Phaneuf
Research output: Contribution to journal › Article › peer-review