Automated Multi-Scale Microstructure Heterogeneity Analysis of Selective Electron Beam Melted TiAl6V4 Components: english

Philip Prangnell, Hao Zhao, Alphons A Antonysamy, J. Meyer, S.W. Williams

    Research output: Contribution to conferencePaperpeer-review

    200 Downloads (Pure)

    Fingerprint

    Dive into the research topics of 'Automated Multi-Scale Microstructure Heterogeneity Analysis of Selective Electron Beam Melted TiAl6V4 Components: english'. Together they form a unique fingerprint.

    Engineering

    Material Science